Santa Clara Laboratories Analytical 2398 Walsh Avenue Electrical characterization and measurements, SPICE models extraction and validation of electronic devices (dc, ac, impedance, s-parameters, 1/f and thermal noise) in a wide range of temperatures (even cryogenic, e.g. 77?K). Time domain reflectometry (TDR) for the electrical characterization of IC packages, printed circuit boards, connectors, interconnect, cables. Failure analysis of semiconductor devices, electronic devices, printed circuit boards (PCB). Semiconductor devices de-processing, IC package de-capsulation. Cross-Sectioning, parallel and angle lapping. Destructive physical analysis. Detection and Analysis of counterfeit electronic components. High resolution optical Microscopy, Scanning Electron Microscopy (SEM), Auger Electron Spectroscopy (AES).

Santa Clara CA Laboratories Analytical ECR Laboratory, Inc. measurements SPICE models electronic devices TDR packages printed circuit boards connectors cables failure analysis semiconductor PCB cross section parallel angle lapping destructive physical detection counterfeit microscopy electron SEM measurements SPICE models electronic devices TDR packages printed circuit boards connectors cables failure analysis semiconductor PCB cross section parallel angle lapping destructive physical detection counterfeit microscopy electron SEM Business Reviews ECR Laboratory, Inc. Testimonials